Autotestcon '87

Autotestcon '87

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proceedings, San Francisco, November 3-5, IEEE International Automatic Testing Conference, Moscone Center, San Francisco, ... By using advances in maintenance bus standards and exploiting increased useage of design for test in digital integrated circuits used in line replaceable ... aquot;Maintenance Concepts for VHSICaquot;, December 1986 (11) Parag K. Lala, aquot;Fault Tolerant and Fault Testable Hardwareanbsp;...

Title:Autotestcon '87
Author: Institute of Electrical and Electronics Engineers
Publisher: - 1987

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