High-reliability Devices

High-reliability Devices

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Group C Elactrical Characteristics Sampling Tens ELECTRICAL CHARACTERISTICS For Design Guidance Only 10 10 10 tO 10 ... 5 - Burn-in and operating life test circuit. ... TEST CONDITIONS LIMJTS CHARACTERISTIC SYMBOL Supply Voltage (VAp) - 5 V to 15 V MINIMUM MAXIMUM ... Rs alt; 50 kS2 0.7 mV Average Temperature Coefficient of Input Offset Voltage vio -55to+125AdC 3 uV/0C Input Offsetanbsp;...

Title:High-reliability Devices
Author: RCA Corporation. Solid State Division
Publisher: - 1976

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